Scanning Probe Microscopy Facility

The Scanning Probe Microscopy Facility consists of instruments that provide very high resolution, three dimensional surface topography on an increasing variety of samples and are powerful tools for surface examination.

The Atomic Force Microscope (AFM) uses the sense of touch and measures the topography by mechanically moving a sharp probe across the sample to "feel" the contours of the surface in a manner similar to a phonograph stylus tracing the grooves of a record. Moreover, it can operate under liquids, including the corrosive solutions frequently encountered in industry.

The instruments available are as follows:

Digital Instruments NanoScope IIIE

• Contact mode operation in air
• Atomic resolution
• Flowing liquid cell, for non-corrosive fluids at room temperature
• Simultaneous sample viewing with optical microscope

Digital Instruments Dimension 3000

• Contact mode and "tapping mode" operation (for viewing soft samples and weakly adsorbed species)
• In situ liquid cell under ambient conditions
• Phase imaging, for the study of composite materials, magnetic alloys, etc
• Large sample imaging capability

Molecular Imaging PicoAFM – atomic force microscope

• Sample imaging in controlled gaseous environment (for air sensitive samples, etc)
• In situ imaging of samples in corrosive fluids (high and low pH) and at high temperature (up to ca 100^oC)
• Operation in contact and intermittent contact modes

Molecular Imaging PicoSTM – scanning tunnelling microscope

• Sample imaging in controlled gaseous environment (for air sensitive samples, etc), with glove box for sample transfer
• In situ imaging of samples in corrosive fluids

Nikon Optiphot2 optical microscope

• Double beam interferometry with Mirau objectives
• Polarising and tilting stages
• In situ flowing liquid cells
• High resolution digital camera and image processing